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NSG 3040 脉冲群浪涌综合测试仪

型号
NSG 3040

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详细信息

NSG 3040脉冲群浪涌综合测试仪主要优点和技术参数
模块化, 可扩展系统
浪涌电压至4.4 kV
EFT/脉冲群至 4.8 kV/1 MHz
PQT 至 16 A/260 VAC & DC
7“ 彩色触摸屏方便使用
TA (Test 助手) 是快速测试解决方案
NSG 3040脉冲群浪涌综合测试仪测试过程中可调节参数
范围广泛的测试附件加在电源线和数据线上的瞬变脉冲、供电中断和电磁场经常会
造成电子线路和设备出现故障。抗扰度测试可以确保例行操作
中各个元件、仪器及系统的工作符合产品标准要求。Teseq公司
可以提供各种脉冲抗扰度发生器,以及各种耦合网络、天线、
电源变压器和附件以保证能够安全、可靠地重现干扰现象。
 抗扰度测试综合性概念 
NSG 3040 满足各种新的IEC/EN标准要求
 创新性PDA操作概念
 开放式结构
 TCP/IP通讯
 各种校准附件
 基于Windows的软件
NSG 3040英文介绍:
The NSG 3040 system is designed to fulfil conducted EMC test requirements for CE mark testing and includes generally combination wave, EFT pulses and PQT. Extensive expansion capabilities enable the system to be configured for a much broader range of applications. The easy to use and convenient  multifunction generator to simulate electromagnetic interference effects for immunity testing in conformity with international, national and in-house standards including the latest IEC/EN standards.

The NSG 3040 completes the multifunction generator family with the new Teseq design philosophy. This innovative design is based on modular architecture to provide a versatile system, that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.

Using state-of-the-art components, the selfcontained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements. Along with the well proven and unique “Master-Slave” concept technology, enables individual pulse modules to be calibrated separay with the calibration data and correction factors stored on the module itself, in the slave controller.

The integration of a high quality and large 7'' color touch panel display with superb contrast makes the control of the NSG 3040 easy. Depending on requirements, the inputs are supported by an integrated keyboard, or by using a wheel with additional keys for sensitivity adjustment. Each parameter’s value is highly visible and all settings can be quickly selected and modified with the generously sized touch input buttons. A stylus is not necessary, and ramp functions are programmed quickly and easily.

Multi-step test procedures can be created and their sequence or parameter values changed easily. Firmware downloads can be performed quickly with the easily accessible SD memory card reader. Tests specified by the user will be saved compley.

The Windows software simplifies test programming and allows compiling of complex test sequences with various types of tests. Test reports can be generated during the test operation allowing the operator to enter observations as the test progresses thus increasing the efficiency of long-term tests.

Producibility may be achieved in combination with a discharge removing device.

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