VectorStar™ 系列是 Anritsu 的高级矢量网络分析仪系列，在现代化工作平台上提供的整体性能。 MS4640B VectorStar 矢量网络分析仪在单台仪器中提供 70 kHz 到 70 GHz 的最宽频率覆盖范围。 70 GHz 的频率固然令人赞叹，但低频端额外带来的二十倍频程更令人激动。
IMDView™ 提供了灵活的菜单栏，修改关键的IMD参数时，可显示实时测量。内部组合选件提供有源器件的单个连接测试，可在S参数和IMD测量之间自动切换，而无需重新连接DUT。
PulseView™ 脉冲测量功能, 结合创新式 IF 数字化选项，能够提供业界的 2.5 ns 脉冲分辨率和 100 dB 动态范围，对于不同的占空比，不需要妥协或平衡性能使用。 PulseView 能够提供脉冲测量的实时显示，且能够同时动态地修改脉冲参数,以及时的验证设计指标。
DifferentialView™ 差分选件, 结合内部双源选项，能够提供差分设备、器件和组件的实时显示分析，且同时能够自动地修改内部双源的相位和幅度关系。
噪音系数测量选项以冷源技术为基础，能够提高噪音系数测量精度。 VectorStar 是仅有的一款能够测量 70 kHz 到 125 GHz 噪音系数的矢量网络分析仪，且配有 30 GHz 到 125 GHz 测量所用的优化噪音接收器。 Additionally, VectorStar is the only VNA that offers a Differential Noise Figure option for characterizing the noise figure of differential devices.
在宽带应用中，ME7838 系列通过一个同轴测试端口就能提供跨距为 70 kHz 到 110 GHz，125 GHz 和 145 GHz 的性能和频率覆盖范围。 Anritsu 所开发的非线性传输线技术的 mmWave 模块，采用紧凑型设计，且同时能够提供高达 145 GHz 高性能。
Anritsu MS4640B 矢量网络分析仪提供了更高水平的性能，能够帮助器件建模工程师实现精确可靠的器件建模；帮助 R&D 工程师尽量扩大其产品设计动态范围，以研发出的设备；帮助制造工程师在保证精准度的情况下地提高其生产测试效率。 标配的 3 年保修，再加上响应迅速的销售支持队伍，MS4640B 矢量网络分析仪定会成为工程师的明智选择。
VectorStar Users Site
The VectorStar Users Site is a location where you can obtain Software, O/S Patches, and needed Utilities for your VectorStar instruments.
The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.
Extraordinary Permittivity Characterization of 4H SiC at Millimeter-wave Frequencies
Lei Li, Mohammad Javad Asadi, School of Electrical and Computer Engineering, Cornell University Steve Reyes, Anritsu Company Patrick Fay, Department of Electrical Engineering, The University of Notre Dame James C. M. Hwang, School of Electrical and Computer Engineering, Cornell University And Department of Materials Science and Engineering, Cornell University. 22 June 2023
Calibration, Repeatability and Related Characteristics of On-wafer, Broadbａnd 70kHz-220 GHz Single-Sweep Measurements
Andrej Rumiantsev, MPI Corporation Jon Martens, Steve Reyes, Anritsu Company. 02 Nov 2020
Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials. 16 Apr 2020
3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; Scientific Reports. 04 Dec 2019
A novel reconfigurable CMOS compatible Ka bａnd bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications. 22 Aug 2019
Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.
Material Measurements
 | Compass Technology Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more. Anritsu and Compass Technology Group Material Measurements Solutions Compass Technology Group VectorStar Integration [video] |
 | Keycom Technologies Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more. Anritsu and Keycom Material Measurement Solution |
 | SWISSto12 Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more. Anritsu and SWISSto12 Material Measurement Solution |
