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IEC 61646 -2008 (英法文版) 太阳能光伏检测设备标准(二)

时间:2010-10-14      阅读:2146

IEC 61646 -2008 (英法文版) 太阳能光伏检测设备标准(二)

  International Standard IEC 61646 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.

  This second edition cancels and replaces the first edition published in 1996. This edition
constitutes a technical revision.

  This edition includes the following significant technical changes with respect to the previous
edition:
  The major change is in the pass/fail criteria. It no longer relies on meeting a plus/minus
criterion before and after each test, but rather on meeting the rated power after all of the tests
have been completed and the modules have been light-soaked. This was done to eliminate
the technology-specific preconditioning necessary to accuray measure the changes caused
by the test. (Some modules lose power in light while others lose power during dark heat.)
Since all modules must work after exposure to light, this seemed liked a good approach and
will streamline the test procedure, hopefully reducing the testing cost.
•  Updated Normative references.
•  Added a definition of “minimum value of maximum output power”. 
•  Modified the wording in Major visual defects to allow some bending and misalignment
without failure.
•  Added requirements to the report from ISO/IEC 17025.
•  Removed the “Twist Test” as was done from IEC 61215, since no one has ever failed this
test.
•  Made the pass/fail criteria for insulation resistance and wet leakage current dependent on
the module area.
•  Added the temperature coefficient of power (δ) to the required measurements.
•  Modified temperature coefficient section to allow for measurements under natural sunlight
or a solar simulator.
•  Deleted reference plate method from NOCT.
•  Added apparatus sections to those test procedures that did not have apparatus sections in
edition 1.
•  Rewrote the hot-spot test.
•  Eliminated edge dip method from wet leakage current test.
•  Changed mechanical load test to 3 cycles to be consistent with other standards.
•  Added bypass diode thermal test.

 

 

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