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经销商厂商性质
上海市所在地
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The Proceq Leeb D hardness tester is versatile and capable of on-site testing of heavy, large or installed parts. Works with the full Leeb probe portfolio and can be combined with Portable Rockwell and UCI.
The Proceq Leeb D hardness tester is rated as highly accurate and offers a field-tested, rugged touchscreen designed for an excellent user experience for measuring and analysis. The unit comes with enhanced software features, analysis functions, ready-to-go reports with powerful built-in reporting features.
Equotip 550 Leeb D takes advantage of a new generation full color, dual processor Touchscreen Unit with enhanced software capabilities. The instrument offers a unique range of functions which ultimay help speed up on-site and laboratory inspections and analysis.
Features:
Instrument Firmware | Automatic compensation for impact direction |
PC Software | Equotip Link allowing direct reporting and custom reports |
Display | 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor |
Memory | Internal 8 GB flash memory (> 1’000’000 measurements) |
Connections | USB host / device and Ethernet |
Additional Features:
Wide Measurement Range | Leeb D impact devices are best suited for on-site testing of heavy, large or already installed parts. |
Broad Hardness Scales Coverage | The measurements are automatically converted to all common hardness scales (HV, HB, HRC, HRB, HRA, HS) as required. |
Impact Devices & Accessories | Proceq offers a wide variety of impact devices along with support rings to serve most hardness testing requirements. |
Test Blocks Portfolio | Extensive range of precise hardness test blocks available for each impact device with different hardness levels for regular verification. |
Applications:
Standard to large objects | Yes |
Round objects | In combination with support rings |
Light objects | With impact device Leeb C |
Very hard objects | With impact devices Leeb S and E |
Cast objects | With impact device Leeb G |
Polished objects | With impact device Leeb C |
Limited accessibility | With impact devices Leeb DC and DL |
Additional Applcations: | Fire damage assessment |
Proceq Equotip Leeb D Model Specifications
Native Scale | HL |
Measuring Range | 150 - 950 HL |
Measuring Accuracy | ± 4 HL (0.5% at 800 HL) |
Available Scales | HB, HV, HRA, HRB, HRC, HS, MPA |
Available Probes | Leeb D / DC / DL / S / E / G / |
Combination With Other Methods | Portable Rockwell, UCI |
Average Roughness Ra (µm / µinch) | 7 / 275 (Leeb G) |
Minimum Mass (kg / lbs) | 0.02 / 0.045 (Leeb C) |
Minimum Thickness (mm / inch) | 1 / 0.04 (Leeb C) |
Standards & Guidelines
Standards ASTM A 956 | Guidelines ASME CRTD-91 |
Equotip 550 Unit Specifications
Display | 7” color display 800x480 pixels |
Memory | Internal 8 GB flash memory |
Regional Settings | Metric and Imperial units, multi-language and timezone supported |
Power Input | 12 V +/-25 % / 1.5 A |
Connectors | Probe, USB host / device and Ethernet |
Dimensions | 250 x 162 x 62 mm |
Weight | 1525 g (incl. Battery) |
Battery | 3.6 V, 14.0 Ah |
Battery Lifetime | > 8 h (in standard operating mode) |
Humidity | < 95 % RH, non condensing |
Operating Temperature | -10 °C to +50 °C |
IP | 54 |
Certification | CE |
