二碲化钨晶体 WTe2(Tungsten Ditelluride) 
晶体尺寸：10毫米
电学性能：半金属，type II Weyl semimetal (WSM)
晶体结构：斜方晶系 P
晶胞参数：a = 0.348 nm, b = 0.625 nm, c = 1.405 nm, α = β = γ = 90°
晶体类型：合成
晶体纯度：＞99.995%
属性：半导体

X-ray diffraction on a WTe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10

Powder X-ray diffraction (XRD) of a single crystal WTe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Stoichiometric analysis of a single crystal WTe2 by Energy-dispersive X-ray spectroscopy (EDX).

Raman spectrum of a single crystal WTe2. Measurement was performed with a 785 nm Raman system at room temperature.