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ATF4-PZ Sensor
高级会员第8年
代理商西努光学创建于2003 年,主营工业显微镜及制样设备、镜片测定设备,高速摄像系统、工业内窥镜、机器视觉等工业及科研应用的检测设备及系统集成。
西努光学秉承“以光学为核心,为客户提供解决方案”的经验思路,经过16年的努力,成为众多企业、高校科研单位提供各种专业化的光学系统解决方案。并于2012 年导入SAP 管理系统,通过系统资源整合,为客户提供更优质、快捷的专业化服务。
2016 年,我们积极引进检测设备的同时导入制样等配套设备以丰富我们实验室平台,以更好的为客户提供现场体验,从微米到纳米满足客户从制样到结果分析的一站式体验服务。
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The ATF4-PZ Sensor
WDI’s ATF4-PZ is a high speed, high accuracy, autonomous digital autofocus sensor. Its “Smart Sensor Architecture” (SSA) incorporates a semiconductor laser, built-in CMOS image sensor, FPGA and microprocessor for fast digital image processing. By projecting a laser dot onto the sample and digitally processing the image, the ATF4-PZ provides fast and precise output to accuray control the focus position of external piezo Z actuators and stages. By supplying an analog output, the AFT4 PZ can connect and direct a piezo Z device without the need to go through a secondary controller.
High Accuracy At Fast Speeds
WDI’s ATF4-PZ sensors project their focusing laser directly through the objective lens of the microscope. This “Through The Lens” (TTL) technique allows the ATF4-PZ to provide extremely accurate autofocus, exactly on the microscope’s FOV. The ATF4-PZ’s on board digital processing allows it to couple this accuracy with extremely high speeds. As the ATF4- PZ connects directly to the piezo Z device autofocus times are shortened.
Tracking Autofocus
The ATF4-PZ continually assesses both the distance and direction to focus, updating its data every 0.6 milliseconds. This allows the sensor to keep samples in focus regardless of whether they are stationary or in motion. This powerful tracking autofocus makes the ATF4-PZ perfect for scanning very large specimens quickly and precisely.
Maximum Flexibility
The ATF4-PZ sensor is designed to automatically adjust its laser intensity as well as the image sensor’s exposer time, allowing it to adapt to a wide variety of specimens, from low reflectivity (down to 1%) to highly reflective (up to 99%). It operates very well on plain reflective surfaces such as glass and unpatterned Si wafer. It is compatible with objective lenses from 2X to 100X magnification, and wavelengths including UV, NUV and NIR. The ATF4-PZ includes Laser Enable and Camera Sync features for automatically suspending the laser.
Easy Integration
All of the sensors in WDI’s ATF family are designed with ease of integration in mind. They are compatible with most types of infinity corrected microscope objectives. The AFT4-PZ comes as a stand-alone sensor with analog output for direct connection to an external piezo a Z actuator or stage amplifier. All WDI’s ATF sensors have small, standardized footprints and connections, and can output in either analog or digital formats, making them both easy to install and easy to upgrade as application requirements evolve.
ATF4-PZ Sensor AUTO FOCUS & SCANNING SENSOR
Structured Light Pattern | Single Dot |
Sensor Wavelength | Choice of 660nm or 785nm |
Image Detector | Line Scan CMOS |
Internal Update Rate | 20kHz |
Static Autofocus Accuracy | ± 1/4 Objective Depth of Focus |
Fast Tracking Autofocus Accuracy | ± 1/2 Objective Depth of Focus |
General Performance | |
Output Data Rate | 1.7kHz |
Reflectivity Adaption Delay | 1ms |
Laser Type | Semiconductor |
Laser Safety | Class 2 660, 785nm |
Weight | 250g |
Dimensions | 40 X 40 X 120mm |
Maximum Cable Length | 1.8m |
Compliance | CE SEMI |
External Requirements | |
Specimen Reflectivity | 1% ~ 99% |
Glass Thickness | > 0.5mm |
Diffusing Specimen | No |
Specular Specimen | Yes |
Patterned Specimen | No |
Textured Specimen | No |
Operating Specifications | |
Input Voltage | 18V ~ 25V, Nominal 24V |
Operating Temperature | 18°C ~ 35°C |
Storage Temperature | 10°C ~ 45°C |
Humidity | 10% ~ 75% Non Condensing |