PID操作软件
PID操作软件

PIDStudioPID操作软件

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价格区间:面议;应用领域:医疗卫生,环保,食品,化工,能源;
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医疗卫生,环保,食品,化工,能源
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束蕴仪器(上海)有限公司

束蕴仪器(上海)有限公司

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产品简介

PID操作软件PIDStudio是一个很*的软件,它非常容易操作和直观,因为它根据我们用户的反馈持续更新和改进。

详细介绍

PID操作软件PIDStudio是一个很*的软件,它非常容易操作和直观,因为它根据我们用户的反馈持续更新和改进。


通过PIDStudio,可以输出和比较多个测量的下列参数:

●   并联电阻

●   电导率

●   功率损耗

●   泄漏电流

●   温度

●   湿度

●   高电压


PID操作软件主要特点:

●   用户结构

●   输出功能

●   谱图

●   通过和失败标准

●   分析功能包

●   可控制任意数量的设备



参考文献: cells  (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced  degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163

(2)V. Naumann, K. Ilse, M. Pander, J. Tröndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic

modules, AIP Conference Proceedings 2147, 090005 (2019).

(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects  at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).

(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Großer, S. Richter, A. Hähnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under  Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. Pöblau, S. Großer, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible  PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential  Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.




上一篇:应用分享 | 使用高分辨率表面光电压(SPV)光谱分析SiC晶圆的表面质量 下一篇:弗莱贝格PIDcon bifacial|双面电池的可逆与不可逆PID快速测试解决方案
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