200KV透射电镜Spectra 200 TEM
200KV透射电镜Spectra 200 TEM High throughput TEM and STEM microscope for all materials science applications
Key Features
Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
High-resolution STEM imaging performance for all accelerating voltages
Unprecedented sensitivity with the Panther STEM detection system
Advanced STEM imaging capabilities
New possibilities in STEM analytics with Spectra 200 S/TEM
Specifications
| Spectra 200 (S)TEM | Probe corrector: Uncorrected:
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| Analytics and detectors | Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition Analytics for live peak identification and background fitting during ultra-fast EDS acquisition Symmetric EDS detector design allows for combined tomographic EDS
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| Available detector options | HAADF detector On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total) Thermo Scientific Ceta 16M Camera (optionally with speed enhancement) Gatan OneView/OneView IS cameras Gatan energy filter series Electron microscope pixel array detector (EMPAD)
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