起订量:
Helios 5 Laser PFIB System
The Thermo Scientific Helios 5 Laser PFIB System combines the best-in-class monochromated Elstar Scanning Electron Microscopy (SEM) Column with a plasma focused ion beam (PFIB) and a femtosecond laser to produce a high-resolution imaging and analysis tool with in-situ ablation capability, offering unprecedented material removal rates for fast millimeter-scale characterization at nanometer resolution.
Key Features
Millimeter-scale cross sections with up to 15,000x faster material removal than a typical gallium focused ion beam.
The same coincident point for all 3 beams (SEM/PFIB/laser) enables accurate and repeatable cut placement and 3D characterization.
Includes non-conductive or ion-beam-sensitive samples.
High-quality gallium-free TEM and APT sample preparation and high-resolution imaging capabilities.
Acquire data for much larger volumes within a shorter amount of time.
Extraction of subsurface TEM lamella or chunks for 3D analysis.
No need to transfer samples between different instruments for imaging and cross-sectioning.
Specifications
Femtosecond-laser specifications | ||
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Laser integration |
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Laser Output | ||
First Harmonic |
| 1030 nm (IR) |
| <280 fs | |
Second Harmonic |
| 515 nm (green) |
| <300 fs | |
Optics | ||
Coincident point |
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Objective lens |
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Polarization |
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Repetition rate |
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Position accuracy |
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Protective shutter |
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Software |
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Safety |
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