产品简介
200KV透射电镜Spectra 200 TEM
使用无边缘效应成像 (FFI) 可在每个样品区采集更多的图像，从而提高了图片采集的日产出。 听听 FFI 如何帮助 Elizabeth Villa 博士实验室的日常研究。
详细介绍
200KV透射电镜Spectra 200 TEM
200KV透射电镜Spectra 200 TEM High throughput TEM and STEM microscope for all materials science applications
Key Features
Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
High-resolution STEM imaging performance for all accelerating voltages
Unprecedented sensitivity with the Panther STEM detection system
Advanced STEM imaging capabilities
New possibilities in STEM analytics with Spectra 200 S/TEM
Specifications
| Spectra 200 (S)TEM | Probe corrector: Uncorrected:
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| Analytics and detectors | Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition Analytics for live peak identification and background fitting during ultra-fast EDS acquisition Symmetric EDS detector design allows for combined tomographic EDS
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| Available detector options | HAADF detector On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total) Thermo Scientific Ceta 16M Camera (optionally with speed enhancement) Gatan OneView/OneView IS cameras Gatan energy filter series Electron microscope pixel array detector (EMPAD)
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